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The analysis of a thin SiO2/Si3N4/SiO2 stack: A comparative study of low-energy heavy ion elastic recoil detection, high-resolution Rutherford backscattering and secondary ion mass spectrometry

✍ Scribed by B. Brijs; T. Sajavaara; S. Giangrandi; T. Janssens; T. Conard; K. Arstila; K. Nakajima; K. Kimura; A. Bergmaier; G. Dollinger; A. Vantomme; W. Vandervorst


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
208 KB
Volume
249
Category
Article
ISSN
0168-583X

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