✦ LIBER ✦
The Activation Gate of a Voltage-Gated K+ Channel Can Be Trapped in the Open State by an Intersubunit Metal Bridge
✍ Scribed by Miguel Holmgren; Ki Soon Shin; Gary Yellen
- Book ID
- 117607081
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 123 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0896-6273
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