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Tests of the methods of analysis of picosecond lifetimes and measurement of the half-life of the 569.6 keV level in 207Pb

✍ Scribed by E. de Lima; H. Kawakami; A. de Lima; R. Hichwa; A.V. Ramayya; J.H. Hamilton; W. Dunn; H.J. Kim


Publisher
Elsevier Science
Year
1978
Weight
311 KB
Volume
151
Category
Article
ISSN
0029-554X

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