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Test–retest reliability and criterion validity of the Chinese version of CBCL, TRF, and YSR

✍ Scribed by Patrick W.L. Leung; S.L. Kwong; C.P. Tang; T.P. Ho; S.F. Hung; C.C. Lee; S.L. Hong; C.M. Chiu; W.S. Liu

No coin nor oath required. For personal study only.

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