Testing the effects of reflow on tantalum capacitors

✍ Scribed by J. Virkki; T. Seppälä; P. Raumonen

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 954 KB
• Volume: 50
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2010.07.055

✦ Synopsis

This study focuses on testing the effects of one and several reflow processes on surface mount tantalum capacitor characteristics, especially in a humid environment. Effects on maximum voltage, moisture absorption, and durability in the standard 85/85 test were examined. Research was done by using a 0-90 V voltage test, a 100% RH moisture absorption test, and the standard 85/85 test. Results show that a reflow process weakens the characteristics of tantalum capacitors and also affects their moisture absorption. Several reflow processes have a greater effect. Possible reasons are discussed in this paper.