Testing reconfigured RAM's and scrambled address RAM's for pattern sensitive faults

✍ Scribed by Franklin, M.; Saluja, K.K.

• Book ID: 119778061
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 823 KB
• Volume: 15
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.536714