✦ LIBER ✦
Testing of Quasi-Ballistic Field-Effect Transistors with Schottky Gate by 1/fNoise Measurements
✍ Scribed by A. V. Belyakov; A. V. Moryashin; M. Yu. Perov; A. V. Yakimov; L. K. J. Vandamme
- Book ID
- 106511656
- Publisher
- Springer US
- Year
- 2005
- Tongue
- English
- Weight
- 237 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0033-8443
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