✦ LIBER ✦
Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients
✍ Scribed by Madonna, G.; Ferrero, A.; Pirola, M.; Pisani, U.
- Book ID
- 114544537
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 190 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9456
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