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Testing in two-dimensional iterative logic arrays: W T Cheng (Eng. Res. Center, AT&T, Princeton, NJ, USA), J H Patel Comput. & Math. with Appl. (GB) vol. 13, no. 5-6, pp. 443–454 (1987)


Book ID
108361441
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
71 KB
Volume
18
Category
Article
ISSN
0026-2692

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