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Testing for unit roots with very high frequency spot exchange rate data

✍ Scribed by Charles A.E. Goodhart; Patrick C. McMahon; Yerima L. Ngama

Book ID: 113248191
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 759 KB
Volume: 15
Category: Article
ISSN: 0164-0704
DOI: 10.1016/0164-0704(93)90002-4

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