✦ LIBER ✦
Testing cross-talk induced delay faults in digital circuit based on transient current analysis
✍ Scribed by Wang Youren; Deng Xiaogian; Cui Jiang; Yao Rui; Zhang Zhai
- Book ID
- 105625927
- Publisher
- Wuhan University
- Year
- 2006
- Tongue
- English
- Weight
- 355 KB
- Volume
- 11
- Category
- Article
- ISSN
- 1007-1202
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