Testing content-addressable memories using functional fault models and march-like algorithms

✍ Scribed by Kun-Jin Lin; Cheng-Wen Wu

• Book ID: 119778620
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 289 KB
• Volume: 19
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.845082