Testing Contaminated Insulators at Project UHV for Voltage Levels of the Future

✍ Scribed by Lloyd, K.J.

• Book ID: 114621596
• Publisher: IEEE
• Year: 1981
• Tongue: English
• Weight: 645 KB
• Volume: EI-16
• Category: Article
• ISSN: 0018-9367
• DOI: 10.1109/tei.1981.298420