✦ LIBER ✦
Testable realizations for FET stuck-open faults in CMOS combinational logic circuits: Reddy, S M and Reddy, M KIEEE Trans. Computers Vol C-35 No 8 (August 1986) pp 742–754
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 93 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0141-9331
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