𝔖 Bobbio Scriptorium
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Test vehicle for a wafer-scale field programmable gate array : Benoit Dufort and Glenn H. Chapman. IEEE Transactions on Components, Packaging and Manufacturing Technology, Part B, 18 (3), 431 (August 1995).


Book ID
108362340
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
114 KB
Volume
37
Category
Article
ISSN
0026-2714

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