✦ LIBER ✦

Test techniques for voltage/humidity-induced degradation of thin-film photovoltaic modules

✍ Scribed by R.S. Sugimura; L.C. Wen; G.R. Mon; R.S. Ross Jr.

Publisher: Elsevier Science
Year: 1990
Weight: 727 KB
Volume: 28
Category: Article
ISSN: 0379-6787
DOI: 10.1016/0379-6787(90)90043-5

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✦ Synopsis

Thin-film photovoltaic modules, deployed world-wide in various applications, experience considerably different levels of environmental and electrical stresses. Test techniques, combining both accelerated and realtime laboratory and outdoor field tests, have been used to develop a proposed qualification test that rapidly assesses the level of susceptibility of a module to voltage/humidity-induced degradation.

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✍ R.G. Ross Jr.; G.R. Mon; L.C. Wen; R.S. Sugimura 📂 Article 📅 1989 🏛 Elsevier Science ⚖ 597 KB

A number of important degradation mechanisms that determine the life of thin-film photovoltaic (PV) modules are driven by voltages and currents, either internal to the module, or between the module and its external mounting environment. Two important mechanisms are electromigration and electrochemic