Test power reductions through computationally efficient, decoupled scan chain modifications

✍ Scribed by Sinanoglu, O.; Orailoglu, A.

• Book ID: 114668379
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 283 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/tr.2005.847276