✦ LIBER ✦

Test Pattern Generation of Relaxed -Detect Test Sets

✍ Scribed by Neophytou, S.N.; Michael, M.K.

Book ID: 118242000
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 831 KB
Volume: 20
Category: Article
ISSN: 1063-8210
DOI: 10.1109/tvlsi.2010.2102056

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Pattern Classification || Generation of

Pattern Classification || Generation of Training and Test Data Sets

✍ Abe, Shigeo 📂 Article 📅 2001 🏛 Springer London ⚖ 919 KB

Generation of test patterns without proh

Generation of test patterns without prohibited pattern set

✍ Sikdar, B.K.; Ganguly, N.; Chaudhuri, P.P. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 536 KB

Generation of Broadside Transition-Fault

Generation of Broadside Transition-Fault Test Sets That Detect Four-Way Bridging Faults

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 537 KB

Recursive pseudoexhaustive test pattern

Recursive pseudoexhaustive test pattern generation

✍ Rajski, J.; Tyszer, J. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 590 KB

Less expensive test pattern generation t

Less expensive test pattern generation technique

✍ Abd-El-Barr, M.H.; McCrosky, C.; Li, W. 📂 Article 📅 1996 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 707 KB

Test pattern generation for droop faults

✍ Mitra, D.; Sur-Kolay, S.; Bhattacharya, B.B.; Kundu, S.; Nigam, A.; Dey, S.K. 📂 Article 📅 2010 🏛 The Institution of Engineering and Technology 🌐 English ⚖ 569 KB