Test of high-angular-resolution X-ray photoelectron diffraction and holographic imaging for c(2 × 2)S on Ni(001)

✍ Scribed by R.S. Saiki; A.P. Kaduwela; Y.J. Kim; D.J. Friedman; J. Osterwalder; S. Thevuthasan; C.S. Fadley

• Publisher: Elsevier Science
• Year: 1992
• Weight: 150 KB
• Volume: 279
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(92)90238-z