Test of annealed Czochralski grown silicon crystals as X-ray diffraction elements with 145 keV synchrotron radiation

✍ Scribed by J.R. Schneider; H. Nagasawa; L.E. Berman; J.B. Hastings; D.P. Siddons; W. Zulehner

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 510 KB
• Volume: 276
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(89)90597-4