✦ LIBER ✦
Test methodology of a new upset mechanism induced by protons in deep sub-micron devices
✍ Scribed by C. Weulersse; F. Miller; D. Alexandrescu; E. Schaefer; O. Crepel; R. Gaillard
- Book ID
- 119326707
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 851 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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