✦ LIBER ✦
Test generation for VLSI chips with embedded memories : E. K. Vida-Torku, J. A. Monzel, T. L. Bossis, C. E. Radke and D. M. Wu. IBM J. Res. Dev.34(2/3), 276 (1990)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 133 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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