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Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker

✍ Scribed by N. De Filippis

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 193 KB
Volume: 530
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2004.05.046

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