Tensile strength and fracture defects expanded by subcritical crack growth of silicon nitride at high temperatures

✍ Scribed by T. Ohji; Y. Yamauchi; W. Kanematsu; S. Ito

• Book ID: 104911385
• Publisher: Springer
• Year: 1990
• Tongue: English
• Weight: 763 KB
• Volume: 9
• Category: Article
• ISSN: 0261-8028
• DOI: 10.1007/bf00726514