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Temperature stability of permittivity and dielectric relaxation in multilayered thin films of (Ba[sub 0.80]Sr[sub 0.20])(Ti[sub 1−x]Zr[sub x])O[sub 3] with a compositionally graded layer

✍ Scribed by B. L. Cheng; C. Wang; S. Y. Wang; T. W. Button; H. B. Lu; Y. L. Zhou; Z. H. Chen; G. Z. Yang

Book ID: 125519162
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 248 KB
Volume: 84
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1767605

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