## Abstract The temperature behavior of the integrated intensity of photoluminescence (PL) emission from ordered GaInP~2~ epitaxial layer was measured at temperatures of 10 β 300 K. Within this temperature range the PL emission is dominated by bandβtoβband radiative recombination. The PL intensity
Temperature quenching of photoluminescence of ordered GaInP2 alloy under different excitation densities
β Scribed by T. Prutskij; C. Pelosi; G. Attolini
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 167 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0232-1300
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β¦ Synopsis
The photoluminescence (PL) emission from an epi-structure containing an atomically ordered GaInP 2 layer and a GaAs layer was studied under excitation power densities of 0.03 -3 W/cm 2 at temperatures of 10 to 300 K. The quenching of the integrated PL intensity from both: the GaInP 2 and the GaAs layers is stronger under low excitation, than under high excitation density. The temperature dependence, however, have different shapes being the PL decay observed for the GaInP 2 layer stronger than that for the GaAs layer. Comparing the temperature dependence of the PL intensity from the ordered GaInP 2 and the GaAs layers under different excitation densities and analyzing them together, we conclude that the inhomogeneity of the ordered layer is responsible for the different temperature behavior of the GaInP 2 alloy PL emission. To explain the experimentally observed PL intensity temperature dependence an additional nonradiative recombination mechanism due to a thermally activated escape of the carriers from its confinement within regions of lower bandgap has to be taken into account.
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