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Temperature-jump FT-IR time-resolved spectrometry

โœ Scribed by Deborah C. Sherman; James A. de Haseth


Publisher
Springer
Year
1988
Tongue
English
Weight
127 KB
Volume
94
Category
Article
ISSN
0026-3672

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A temperature-jump device for time-resol
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We describe a temperature-jump device that permits time-resolved studies of thin cryo-transmission electron microscopy specimens. The specimen is rapidly heated to induce a change in microstructure just prior to cryo-fixation. The apparatus consists of a xenon arc lamp equipped with a shutter contro