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Temperature Effects on Failure and Annealing Behavior in Dynamic Random Access Memories

✍ Scribed by Wilkin, Neil D.; Self, Charles T.

Book ID
114662470
Publisher
IEEE
Year
1982
Tongue
English
Weight
885 KB
Volume
29
Category
Article
ISSN
0018-9499

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Dynamic Random Access Memory Effect and
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✍ Guofeng Tian; Dezhen Wu; Shengli Qi; Zhanpeng Wu; Xiaodong Wang πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 394 KB

## Abstract A functional polyimide, hexafluoroisopropyl bis(phthalic dianhydride)/3,6‐diaminocarbazole (6FDA/DAC), in which DAC serves as electron donor and 6FDA as electron acceptor, has been synthesized in our present work. Electrical characterization results on the sandwiched polyimide memory de