✦ LIBER ✦
Temperature effect on defect evolution in 800 keV Ge-implanted Si/SiGe multi-layered structure
✍ Scribed by P.I. Gaiduk; A.Nylandsted Larsen; J.Lundsgaard Hansen; E. Wendler; W. Wesch
- Book ID
- 108238352
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 360 KB
- Volume
- 340-342
- Category
- Article
- ISSN
- 0921-4526
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