✦ LIBER ✦
Temperature dependent threshold behavior of depletion mode MOSFETs—Characterization and simulation : F. H. Gaensslen and R. C. Jaeger. Solid-St. Electron.22, 423 (1979)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 132 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
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