Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

✍ Scribed by Y.J. Feng; T. Jiang; J. Sun; L.Y. Wu; K.L. Wang

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 234 KB
• Volume: 122
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/j.mseb.2005.04.017