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Temperature dependent effects and catastrophic burnout of the integrated series impatt structure (ISIS) diodes

โœ Scribed by A. Christou; N. Papanicolaou; H. Grubin; G. Halkias


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
647 KB
Volume
32
Category
Article
ISSN
0038-1101

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