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Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS[sub 2]

✍ Scribed by Krustok, J.; Raudoja, J.; Jaaniso, R.


Book ID
120274439
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
348 KB
Volume
89
Category
Article
ISSN
0003-6951

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