✦ LIBER ✦
Temperature dependence of the Raman linewidth and frequency shift in Ge and Si : S. Safran and B. Lax, Francis Bitter National Magnet Laboratory and Physics Department, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, U.S.A.
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 338 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0038-1098
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