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Temperature dependence of the point defect properties of GaN thin films studied by terahertz time-domain spectroscopy

✍ Scribed by Fang, HeNan; Zhang, Rong; Liu, Bin; Li, YeCao; Fu, DeYi; Li, Yi; Xie, ZiLi; Zhuang, Zhe; Zheng, YouDou; Wu, JingBo; Jin, BiaoBing; Chen, Jian; Wu, PeiHeng

Book ID: 121411860
Publisher: Science in China Press (SCP)
Year: 2013
Tongue: English
Weight: 632 KB
Volume: 56
Category: Article
ISSN: 1672-1799
DOI: 10.1007/s11433-013-5202-6

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