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Temperature dependence of the optical properties of CuMoO4

✍ Scribed by G. Steiner; R. Salzer; W. Reichelt


Publisher
Springer
Year
2001
Tongue
English
Weight
78 KB
Volume
370
Category
Article
ISSN
1618-2650

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Temperature Dependence of Hexagonal-GaN
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First, spectroscopic ellipsometry (SE) is carried out at 300 K together with reflectivity measurements versus temperature from 4 to 300 K, in order to determine the temperature dependence of the refractive index of h-GaN films in the transparent region (350 to 600 nm). The SE measurements are carrie