Temperature dependence of the EPR line width and a relaxation of Cr3+ ions in ZnWo4

✍ Scribed by A. A. Bugai; M. D. Glinchuk; M. F. Deigen; V. M. Maksimenko

• Publisher: John Wiley and Sons
• Year: 1971
• Tongue: English
• Weight: 235 KB
• Volume: 44
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/pssb.2220440120

✦ Synopsis

Abstract

The change of the EPR line width, shape, and angular dependence of the halfwidth of Cr^3+^ ions in ZnWO~4~ is investigated in the temperature range from 4.2 to 1200 °K. It is shown that the EPR line broadening at high temperatures is due to the spin‐phonon interaction. Two‐ and four‐phonon processes of Raman‐type play the main part in relaxation. Experimental data on high‐temperature line broadening are used to evaluate the spinlattice relaxation time at liquid helium temperature.