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Temperature Dependence of the Charge-Carrier Removal Rate in n-GaAs Containing Defect Clusters

โœ Scribed by Lomako, V. M. ;Starostin, P. Ya.


Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
153 KB
Volume
85
Category
Article
ISSN
0031-8965

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