✦ LIBER ✦
Temperature dependence of residual stress in epitaxial GaAs/Si(100) films determined from photoreflectance spectroscopy data
✍ Scribed by R. V. Kuz’menko; A. V. Ganzha; O. V. Bochurova; É. P. Domashevskaya; J. Schreiber; S. Hildebrandt; S. Mo; E. Peiner; A. Schlachetzki
- Book ID
- 110120300
- Publisher
- Springer
- Year
- 2000
- Tongue
- English
- Weight
- 94 KB
- Volume
- 34
- Category
- Article
- ISSN
- 1063-7826
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