Temperature dependence of composition ratio of Bi2Sr2CaCu2O8+δ film by PLD method
✍ Scribed by E. Kume; H. Fujino; X. Zhao; S. Sakai
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 371 KB
- Volume
- 412-414
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
We have prepared Bi 2 Sr 2 CaCu 2 O 8þd (Bi-2212) thin films by a pulse laser deposition (PLD) method followed by postannealing. The thin films were grown on MgO substrates at 400-630 °C and 100 mTorr oxygen. They were about 200 nm thick. The crystalline structure of thin films deposited at lower temperature (470 °C) was amorphous. The films deposited at higher temperature (550 °C) began to crystallize (c-axis oriented) but it turned out that Bi decreased with an increase temperature. After deposition, post-annealing were performed at 860-880 °C in a tubular furnace with mixed gas (Ar:O 2 ¼ 93:7, 1 atm, 0.2 l/min flow) for 3 h. Bi did not decrease with the increase of post-annealing temperature up to 870 °C. The critical temperature of film was 78 K, and the root-mean-square (RMS) roughness in 10 lm square was less than 10 nm.
📜 SIMILAR VOLUMES
We present angular resolved photoemission spectroscopy measurements about the Fermi surface of a Bi2Sr2CaCu2Os+ (Bi2212) thin film. Dispersion curves in two directions are discussed. It is confirmed that the Fermi surface observed on the Bi2212 thin film fits the bulk Fermi surface.