✦ LIBER ✦
Temperature-cycling acceleration factors for aluminum metallization failure in VLSI applications : C. F. Dunn and J. W. McPherson. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 252 (March 1990)
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 125 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0026-2714
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