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Temperature and frequency dependencies of AC and dielectric characterizations of copper tetraphenyl porphyrin thin films

✍ Scribed by El-Nahass, M.M.; Farag, A.A.M.; Abu-Samaha, F.S.H.; Elesh, Eman


Book ID
120820313
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
650 KB
Volume
99
Category
Article
ISSN
0042-207X

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