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TEM Study on Diffusion Process of NiFe Schottky and MgO/NiFe Tunneling Diodes for Spin Injection in Silicon
✍ Scribed by Jehyun Lee; Uhrmann, T.; Dimopoulos, T.; Bruckl, H.; Fidler, J.
- Book ID
- 114653772
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 522 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9464
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