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TEM Study of the Behavior of Dislocations during ELO of GaN

✍ Scribed by V. Bousquet; P. Vennéguès; B. Beaumont; M. Vaille; P. Gibart

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 263 KB
Volume: 216
Category: Article
ISSN: 0370-1972
DOI: 10.1002/(sici)1521-3951(199911)216:1<691::aid-pssb691>3.0.co;2-8

No coin nor oath required. For personal study only.

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