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TEM study of microstructure of YBa2Cu3Oy bicrystal grain boundary junctions grown on Y2O3 stabilized ZrO2 bicrystal

✍ Scribed by D.-P. Yu; X.-D. Hu; Y.-Z. Wang; Y.-D. Dai; S.-G. Wang; L.-P. You; Z.-Q. Liu; Z. Zhang

No coin nor oath required. For personal study only.

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