TEM investigation of the microstructural evolution during mev helium implantation in copper

✍ Scribed by Afaf A. Gadalla; W. Jäger; P. Ehrhart

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 577 KB
• Volume: 137
• Category: Article
• ISSN: 0022-3115
• DOI: 10.1016/0022-3115(85)90051-0