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TEM in situ study of degradation mechanisms induced by temperature annealing and electron beam irradiation in a ZnSe/GaAs heterostructure

✍ Scribed by S. Lavagne; C. Levade; G. Vanderschaeve


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
362 KB
Volume
128
Category
Article
ISSN
0921-5107

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