TEM Cross-Section Investigations of Epitaxial Ba2Bi4Ti5O18 Thin Films on LaNiO3 Bottom Electrodes on CeO2/YSZ-Buffered Si(100)

✍ Scribed by D. Hesse; N.D. Zakharov; A. Pignolet; A.R. James; S. Senz

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 502 KB
• Volume: 35
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/1521-4079(200007)35:6/7<641::aid-crat641>3.0.co;2-z