Techniques to Reduce the Soft Error Rate
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Weaver, Christopher; Emer, Joel; Mukherjee, Shubhendu S.; Reinhardt, Steven K.
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Article
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2004
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Association for Computing Machinery
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Transient faults due to neutron and alpha particle strikes posea significant obstacle to increasing processor transistor counts infuture technologies. Although fault rates of individual transistorsmay not rise significantly, incorporating more transistors into adevice makes that device more likely t