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Techniques for high-frequency integrated test and measurement

✍ Scribed by Hafed, M.M.; Roberts, G.W.

Book ID: 114629460
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 475 KB
Volume: 52
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2003.820449

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